Characterization of MITLL CCID20-W97c2 thin 2k x 4k pixel size 15um x 15um new Laser annealing new AR coating Reported by M.Wei Aug.18,1998 "R"(A) and "L"(B) amps work poor serial CTE lower brick wall pattern high frequency QE variation non-uniformity flat field(some low QE spots) higher QE at red side lower fringing TEST CONDITIONS temperature: -127c Voltages: Vdd = +19v Vr = +12.5v Vopg = 0v Vsub = 0v Vp1,2,3 = +2, -6v Vs1,2,3 = +6, -3v Vsw = +5, -5v RG = 10, 0v SCP = 10v read 3800(r)x2048(c) area only. changed gain of preamp. from 21 to 4.83 TEST RESULTS e-/DN: R: 0.46 Determined by Fe55 x-ray test L: 0.45 Determined by Fe55 x-ray test serial CTE R: 0.99997127 Determined by Fe55 x-ray test L: 0.99996215 Determined by Fe55 x-ray test vertical CTE good Determined by Fe55 x-ray test Vertical charge traps: 5 (in 3800(r) x 2048(c) area) Determined by charge-pumping method Read noise: R: 1.9e- DSC timing: 16us on data and 16us on baseline 3.0e- DSC timing: 4us on data and 4us on baseline L: 2.2e- DSC timing: 16us on data and 16us on baseline 3.6e- DSC timing: 4us on data and 4us on baseline linearity: 1 sec. 46.6 2 sec. 106 4 sec. 208 8 sec. 419 16 sec. 834 Full well(nonmpp) 106 ke- Dark current: (@-127c) 2.0e-/pixel/hour QE(%)(average of big area) w.l. -127c 3200 8.6 3500 11.9 4000 41.9 4500 51.4 5000 62.1 6000 69.5 6500 73.0 7000 73.3 8000 80.8 9000 57.2 10000 13.6 Fringing 8000A 6.1% 9000A 9.3% 10000A 16.1% --------------------------------------------- QE variations of CCID20 w97c2 at -127c wavelength QE variation(%) 3200 38.2 3500 38.2 4000 7.0 4500 3.2 5000 0.5