Characterization of MITLL CCID20-W94c2 thin 2k x 4k pixel size 15um x 15um Laser annealing??? new AR coating tested by Lloyd Robinson Reported by M.Wei Aug.13,1998 "R"(A) and "L"(B) amps work poor serial CTE very bad brick wall pattern(type 3) big vertical trap at top-left of CCD when read out from "R" TEST CONDITIONS temperature: -127c Voltages: Vdd = +19v Vr = +12.5v Vopg = 0v Vsub = 0v Vp1,2,3 = +2, -6v Vs1,2,3 = +6, -3v Vsw = +5, -5v RG = 10, 0v SCP = 10v read 3800(r)x2048(c) area only. changed gain of preamp. from 21 to 4.83 TEST RESULTS e-/DN: R: 0.43 Determined by Fe55 x-ray test L: 0.47 Determined by Fe55 x-ray test serial CTE R: 0.99994826 Determined by Fe55 x-ray test L: 0.99994746 Determined by Fe55 x-ray test vertical CTE 0.99998483 Determined by Fe55 x-ray test Vertical charge traps: 5 (in 3800(r) x 2048(c) area) Determined by charge-pumping method Read noise: R: 2.0e- DSC timing: 16us on data and 16us on baseline 2.6e- DSC timing: 4us on data and 4us on baseline L: 2.4e- DSC timing: 16us on data and 16us on baseline 3.2e- DSC timing: 4us on data and 4us on baseline Full well(nonmpp) 108 ke- Dark current: (@-130c) 0.6e-/pixel/hour QE(%)(average of big area) w.l. -121c -131c 3200 8.8 7.5 3500 17.2 14.1 4000 37.6 32.1 4500 44.5 38.2 5000 53.3 43.9 6000 59.9 54.6 6500 64.7 61.7 7000 68.2 66.1 8000 57.3 53.1 9000 33.0 31.8 10000 5.9 5.4 Fringing (N/A) --------------------------------------------- QE variations of CCID20 w94c2 wavelength QE variation(%) -121c -131c 3200 63.0 97.7 3500 54.5 87.7 4000 70.8 102.2 4500 71.6 99.8 5000 77.3 103.3 6000 59.9 75.6 6500 45.3 55.2 7000 37.9 45.1 8000 27.2 31.9 9000 22.2 24.2 10000 23.7 25.7