MIT/Lincoln Labs CCID20 W88C1 CCD Test Results
This is a standard epi phase 2 MIT/Lincoln Labs 2Kx4K
CCD. It has a short between two of the parallel phases. It exhibits the
type 3 pattern (bad brick wall) from the backside boron implant and laser
anneal process. This is a setup and test grade CCD only.
A summary report is available.
Noteworthy points about this CCD include:
- The new backside processing gives this device very bad
QE uniformity which is both color and temperature sensitive.
- A short between phases 2 and 3 in the parallels limits
vertical charge transfer capability.
Original postscript files are available from our anonymous
ftp server and these provide better resolution and clarity than is
usually possible on a web page. Check the ftp server for images of the
CTE problems and the brickwall.
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