Characterization of MITLL
	CCID20-W88c1
	thin 2k x 4k
	pixel size 15um x 15um
	Laser annealing ??
	new AR coating
	Reported by M.Wei 	Jul.31,1998

Both "R"(A) and "L"(B) amps work 
bad brick wall pattern (type 3)
Vertical phase 2 shorted to phase 3
very low full well
bad serial CTE

TEST CONDITIONS

temperature:    -130c
Voltages:	Vdd 	= +19v
		Vr  	= +12.5v
		Vopg 	= 0v
		Vsub	= 0v
		Vp1,2,3 = +2, -6v
		Vs1,2,3 = +6, -3v
          	Vsw	= +5, -5v
		RG	= 10, 0v
		SCP	= 10v

read 3800(r)x2048(c) area only.
changed gain of preamp. from 21 to 4.83

TEST RESULTS

e-/DN:	        R:	0.39		Determined by Fe55 x-ray test
		L:	0.38
serial CTE	R:	0.99988813	Determined by Fe55 x-ray test
		L:	0.99989488	Determined by Fe55 x-ray test


vertical CTE	(N/A)		

Vertical charge traps:	12		(in 3800(r) x 2048(c) area) Determined
					by charge-pumping method

Read noise:             R: 1.8e-        DSC timing: 16us on data and 16us
                                        on baseline
                           2.3e-        DSC timing: 4us on data and 4us
                                        on baseline
                        L: 1.9e-        DSC timing: 16us on data and 16us
                                        on baseline
                           2.6e-        DSC timing: 4us on data and 4us


Full well(nonmpp)	41 ke- 

Dark current:	(@-134c) 1.4e-/pixel/hour	
	


QE(%)(average of big area)
w.l.    -134c
3200     5.8
3500     7.5
4000    17.5
4500    22.1
5000    24.4
6000    37.9
6500    45.4
7000    51.8
8000    45.0
9000    25.6
10000    4.1

Fringing
(N/A) 
---------------------------------------------
QE variations of CCID20 w88c1 (%)
wavelength      -130c	-120c	-110c	-100c
3200		150
3500		162
4000            158	101	58.2	31.8
4500            150
5000            151
6000            97
6500            67	50.9	36.3	20.2
7000            53.7	
8000            34.0
9000            33.3	29.1	22.7	15.1
10000           30.3