Characterization of MITLL
	CCID20-W67c1
	thin 2k x 4k
	pixel size 15um x 15um
	high resistivity CCD

	Reported by M.Wei 	Feb.9,1998

Both "R"(A) and "L"(B) amps imaging when cold
pretty good CCD when temperature=-122c
Many hot columns
Engineering CCD

TEST CONDITIONS

temperature:    -122c
Voltages:	Vdd 	= +19v
		Vr  	= +12.5v
		Vopg 	= 0v
		Vsub	= 0v
		Vp1,2,3 = +2, -6v
		Vs1,2,3 = +6, -3v
          	Vsw	= +5, -5v
		RG	= 10, 0v
		SCP	= 10v

read 3800(r)x2048(c) area only.
changed gain of preamp. from 21 to 4.83

TEST RESULTS

e-/DN:	        R:	0.36		Determined by Fe55 x-ray test
	        L:	0.42		Determined by Fe55 x-ray test
CTE:	        
Serial		R:      v.g.		Determined by Fe55 x-ray test
		L:	v.g. 		Determined by Fe55 x-ray test
Vertical:		v.g.		Determined by Fe55 x-ray test

Read noise:             R:              DSC timing: 16us on data and 16us
                                        on baseline
                           2.6e-        DSC timing: 4us on data and 4us
                                        on baseline
                        L:              DSC timing: 16us on data and 16us
                                        on baseline
                           2.6e-        DSC timing: 4us on data and 4us
                                        on baseline

Full well(nonmpp)	105 ke- 

Vertical traps:				in 3800x2048 area

Dark current(@-130c)	

QE(%)
		-123c
3200A		 0.0	
3500A		 1.9
4000A		29.5
4500A		47.7
5000A		65.3
6000A		84.1
6500A		91.1
7000A		92.9
8000A		84.2
9000A		56.9
10000A		13.7

Fringing
 8000A		 6.8%
 9000A		11.3%
10000A		30.3%
 
---------------------------------------------
QE variation pattern at -120c 
3200    70.6
3500    96.0
4000    19.6
4500    13.3
5000    8.5
6000    3.6
6500A	2.4