Characterization of MITLL
	CCID20-W62c2
	thin 2k x 4k
	pixel size 15um x 15um
	high resistivity CCD
	new AR coating
	new laser annealing

	Reported by M.Wei 	Feb.2,1998

Both "R"(A) and "L"(B) amps imaging when cold
pretty good CCD when temperature=-123c
1 very hot column

TEST CONDITIONS

temperature:    -123c
Voltages:	Vdd 	= +19v
		Vr  	= +12.5v
		Vopg 	= 0v
		Vsub	= 0v
		Vp1,2,3 = +2, -6v
		Vs1,2,3 = +6, -3v
          	Vsw	= +5, -5v
		RG	= 10, 0v
		SCP	= 10v

read 3800(r)x2048(c) area only.
changed gain of preamp. from 21 to 4.83

TEST RESULTS

e-/DN:	        R:	0.36		Determined by Fe55 x-ray test
	        L:	0.35		Determined by Fe55 x-ray test
CTE:	        
Serial		R:      v.g.		Determined by Fe55 x-ray test
		L:	v.g. 		Determined by Fe55 x-ray test
Vertical:		v.g.		Determined by Fe55 x-ray test

Read noise:             R: 2.0e-        DSC timing: 16us on data and 16us
                                        on baseline
                           2.6e-        DSC timing: 4us on data and 4us
                                        on baseline
                        L: 2.3e-        DSC timing: 16us on data and 16us
                                        on baseline
                           2.6e-        DSC timing: 4us on data and 4us
                                        on baseline

Full well(nonmpp)	105 ke- 

Vertical traps:		13		in 3800x2048 area

Dark current(@-130c)	2.1 e-/pixel/hour	over night readout	
						with IO-OFF

QE(%)
		-123c
3200A		10.2	
3500A		12.1
4000A		60.8
4500A		75.5
5000A		82.4
6000A		80.3
6500A		79.7
7000A		77.1
8000A		68.9
9000A		45.0
10000A		11.3

Fringing
 8000A		 8.7%
 9000A		21.9%
10000A		45.9%
 
---------------------------------------------
QE variation pattern at -120c 
3200    40.3
3500    45.0
4000    7.4
4500    3.5
5000    2.1
6000    0.3

QE variations -- temperature

t.	@4000A	@3500A
-63	5.8	20.0(-60c)
-70	6.1
-80	6.3
-90	6.6
-100	6.9
-110	7.4
-120	7.4	45.0