MIT/Lincoln Labs CCID20 W16C2 CCD Test Results
This is a standard resistivity phase 2 MIT/Lincoln Labs
2Kx4K CCD. The backside processing includes the new, improved process.
A summary report is available.
Noteworthy points about this CCD include:
- One very bright column and three other bright columns.
- Excellent CTE
- Low brick wall pattern - only about 7% p-p at 4000A.
Original postscript files are available from our anonymous
ftp server and these provide better resolution and clarity than is
usually possible on a web page. Here are a few figures to illustrate device
highlights:
- Dark
- This image shows what happens with the shorted pixel
in a long dark integration.
- Serial CTE
- The Serial CTE is very good (0.99999) and the parallel
CTE is even better (0.999999).
This is a 1000-second dark. By modifying
the state of the parallel clocks during integration it might be possible
to minimize the glow of one or more of the bright columns, but we haven't
tried this yet. The worst column is near the left edge in this image.
This plot shows the serial
CTE measured by Fe55.
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