Characterization of MITLL CCID20-W16c2 thin 2k x 4k pixel size 15um x 15um New coating and laser annealing Reported by M.Wei Jul.29,1998 Both "R"(A) and "L"(B) amps worked 1 Super hot column and 3 hot columns TEST CONDITIONS temperature: -130c Voltages: Vdd = +19v Vr = +12.5v Vopg = 0v Vsub = 0v Vp1,2,3 = +2, -6v Vs1,2,3 = +6, -3v Vsw = +5, -5v RG = 10, 0v SCP = 10v read 3800(r)x2048(c) area only. changed gain of preamp. from 21 to 4.83 TEST RESULTS e-/DN: R: 0.33 Determined by Fe55 x-ray test L: 0.38 serial CTE R: 0.99999796 Determined by Fe55 x-ray test L: 0.99998890 Determined by Fe55 x-ray test vertical CTE 0.99999937 Determined by Fe55 x-ray test Vertical charge traps: 8 (in 3800(r) x 2048(c) area) Determined by charge-pumping method Read noise: R: 2.7e- DSC timing: 16us on data and 16us on baseline 3.5e- DSC timing: 4us on data and 4us on baseline L: 2.3e- DSC timing: 16us on data and 16us on baseline 3.9e- DSC timing: 4us on data and 4us Full well(nonmpp) 112 ke- Dark current: QE(%) w.l. 3200 8.8 3500 11.9 4000 43.3 4500 53.1 5000 63.0 6000 70.3 6500 69.9 7000 65.6 8000 44.9 9000 18.5 10000 2.6 Fringing 8000A 7.8% 9000A 8.1% 10000A 18.2% --------------------------------------------- QE variations -- wavelength at -130c of w16c2 new LA and AR CCD wavelength QE variation 3200 41.1 3500 37.7 4000 7.4 4500 4.2 5000 2.6 QE variations at 4000A --temperature of w16c2 new LA and AR CCD temperature QE-variation -130 7.4 -125 7.5 -120 7.4 -115 7.3 -110 7.3 -105 7.0 -100 6.9 -95 6.7 -90 6.5 -85 6.7 -80 6.4