Phase 2 MIT/Lincoln Labs CCID20 CCD Test Results Summary

This table attempts to summarize the tests carried out here at Lick. The notation ND means that No Data are available for that item. Data on the "brick wall" pattern is not included in the table. There is really very little to distinguish between the first grade devices - . Our fringing amplitude is crudely measured so put little weight on differences, except the fringing in the thick-epi, high resistivity CCDs is really a lower amplitude.

CCD
(owner)

RO Noise
A &B
Amps
4us DCS

Serial
CTE
A and B
(per pixel)

Parallel
CTE
(per pixel)

QE (%) at
4000
6500
9000

 Dark
e/px/hr		 Traps
 Flatness Fringes
% at
8000
9000
10000

Column
or Row
Defects  
W12C1
(no pick)		 ? good
good		 good 31
86
29		 ND 5 ND 12
7
17		 1HC
See note. 
W16C2
AAO		 3.5,3.9 0.999998
0.999989		 0.999999 43
70
19		 ND 8 9µm p-p 8
8
18		 4HC 
See note.
W18C2
Keck		 3.1,3.0 V. Good
V. Good		 V. Good 40
71
31		 ND 3 6µm p-p 13
5
4		 None

W62C2
Keck
(deferred draft 1)

 2.6,2.6

0.999995
0.999995

 good

61
80
45

  2 @ -120

13

18 µm p-p

9
22
46

1HC

W67C1
NAOJ
 2.6,2.6 V. Good
V. Good		 V. Good 30
91
57		 ND ND ND 7
11
30		 Many HC
W88C1
(no pick)		 2.3 2.6 0.999888
0.999895		 ND 17
45
26		 1.4@ -130 12 ND ND See note.
W88C2
CFHT		 2.3 2.6 good
0.99998		 V. Good 25
55
29		 0.6@ -130 ND ND 8
8
20		 1 PBC
W90C2
AAO		 3.0,2.8 0.99994
0.99994		 0.999995 45
83
368		 1@-110 5 ND 7
6
21		 None
W91C2
CFHT
 2.8,2.8 0.999984
0.999990		 0.999999 40
75
34		 1.4@-110 0 11 µm 7
10
17		 None.
W93C1
ESO		 2.4,2.2 0.999989
0.999996		 0.999999 41
72
32		 1.3@-130 4 3µm 14
12
16		 None. 
W93C2
NAOJ		 3.4 3.5 0.999986
ND		 0.999999 38
74
34 		 1.5@-127  3 10µm 7
19
21		 1HC 
W94C2
UH		 2.6,3.2 0.999948
0.999947		 0.999985 37
65
33		 0.6@-130  5 6µm ND
See note.  
W97C2
Keck
 3.0 3.6 0.999971
0.999962		 good 42
73
57		 2@-127  5 20µm 6
9
16
See note.  
W105C2
(no pick)		 36,3.4 V. Good
V. Good		 V. good 38
71
46		 ND  2 20µm ND
See note.  

Defects Legend:
HC(n) = Hot column at column n.
PBC=Partially Blocked Column.
PBCC(n)=Partially Blocked Column Cluster of n columns where n is 3 or more.

Notes:

W12C1 - One super hot column.
W16C2 - One super hot column and three other much less hot columns.
W88C1 - Parallel phase 2 is shorted to phase 3, making parallel CTE poor. This might be a good 2Kx2K though, since the short appears to be in the section farthest from the serial register.
W94C2 - The brick wall pattern is very bad on this device and there is a cluster of pixels with low-level charge transfer problems.
W97C2 - This CCD has small brick wall QE variations but large variations at a high spatial frequency.
W105C2 - This might be a very nice CCD if Lincoln can determine what failed, and fix it.