Characterization of MITLL
	CCID20 w94c1
	thin 2k x 4k
	pixel size 15um x 15um
	Reported by M.Wei 	Nov.12,1998

Both "R"(A) and "L"(B) amps imaging when cold
poor serial CTE (R and L)
vertical CTE good
low average QE
big QE variation (brick wall)
very hot columns
Engineering CCD

TEST CONDITIONS

temperature:    -130c
Voltages:	Vdd 	= +17.5v 
		Vr  	= +12.5v
		Vopg 	= 0v
		Vsub	= 0v
		Vp1,2,3 = +2, -6v
		Vs1,2,3 = +6, -3v
          	Vsw	= +5, -5v
		RG	= 10, 0v
		SCP	= 10v

changed gain of preamp. from 21 to 4.83

TEST RESULTS

e-/DN:	        R:	0.74		Determined by Fe55 x-ray test
	        L:	0.54		Determined by Fe55 x-ray test
CTE: 
Serial		R:	0.99987411	Determined by Fe55 x-ray test
		L:	0.99987682 	Determined by Fe55 x-ray test
Vertical:		very good	Determined by Fe55 x-ray test

Read noise:             R: 4.4e-        DSC timing: 16us on data and 16us
                                        on baseline
                           6.1e-        DSC timing: 4us on data and 4us
                                        on baseline
                        L: 3.2e-        DSC timing: 16us on data and 16us
                                        on baseline
                           4.1e-        DSC timing: 4us on data and 4us
                                        on baseline

Full well(nonmpp)	N/A 

Vertical traps:		N/A	

Dark current		N/A

QE(%)
		-130c
3200A		 5.4 	
3500A		10.2
4000A		24.6
4500A		29.4
5000A		32.5
6000A		45.1
6500A		54.3
7000A		57.2
8000A		51.9
9000A		29.6
10000A		 5.2

Fringing	N/A
 
---------------------------------------------
QE variation pattern at -130c 
3200A    155.6%
3500A    149.0%
4000A    152.4%
4500A    145.9%
5000A	 149.5%
6000A	  99.6%
6500A	  69.2%
7000A	  55.6%
8000A	  36.0%
9000A	  33.4%
10000A	  34.6%

Gain Noise --Vdd (Vr=12.5v)
"R" amp.:
Vdd	Gain(e-/DN)	Noise
17.5v	0.74		4.4e-
18v	0.52		2.1

"L" amp.:
Vdd	Gain(e-/DN)	Noise
17.5v	0.54		3.2e-
18v	0.46		2.2