Characterization of MITLL
	CCID20 w89c1
	thin 2k x 4k
	pixel size 15um x 15um
	high resistivity CCD
	new AR coating
	new laser annealing
	Reported by M.Wei 	Nov.11,1998

Both "R"(A) and "L"(B) amps imaging when cold
Serial CTE good (R and L)
vertical CTE good
small QE variation (brick wall)
One very hot column and vertical short
Engineering CCD

TEST CONDITIONS

temperature:    -129c
Voltages:	Vdd 	= +17.5v 
		Vr  	= +12.5v
		Vopg 	= 0v
		Vsub	= 0v
		Vp1,2,3 = +2, -6v
		Vs1,2,3 = +6, -3v
          	Vsw	= +5, -5v
		RG	= 10, 0v
		SCP	= 10v

changed gain of preamp. from 21 to 4.83

TEST RESULTS

e-/DN:	        R:	0.70		Determined by Fe55 x-ray test
	        L:	0.51		Determined by Fe55 x-ray test
CTE: 
Serial		R:	0.99999720	Determined by Fe55 x-ray test
		L:	0.99999061 	Determined by Fe55 x-ray test
Vertical:		very good	Determined by Fe55 x-ray test

Read noise:             R: 4.1e-        DSC timing: 16us on data and 16us
                                        on baseline
                           4.4e-        DSC timing: 4us on data and 4us
                                        on baseline
                        L: 2.2e-        DSC timing: 16us on data and 16us
                                        on baseline
                           2.3e-        DSC timing: 4us on data and 4us
                                        on baseline

Full well(nonmpp)	147 ke- 

Vertical traps:		1		in 4096x2048 area
			one short

Dark current(@-130c)	1.26e-/pixel/hour	

QE(%)
		-128c
3200A		10.0 	
3500A		18.3
4000A		46.6
4500A		55.8
5000A		63.7
6000A		76.5
6500A		81.7
7000A		79.5
8000A		66.8
9000A		34.8
10000A		 5.9

Fringing
 8000A		12.0%
 9000A		11.0%
10000A		25.6%
 
---------------------------------------------
QE variation pattern at -128c 
3200    23.0%
3500    24.0%
4000    6.0%
4500    3.9%
5000	2.7%
6000	1.0%
6500	0.2%