MIT/Lincoln Labs CCID20 W85C2 CCD Test Results

This phase 2 MIT/Lincoln Labs 2Kx4K CCD has the improved backside treatment, but unfortunately it also has a charge transfer problem on one half of the serial register. A summary report is available. Noteworthy points about this CCD include:

Original postscript files are available from our anonymous ftp server and these provide better resolution and clarity than is usually possible on a web page. Here are a few figures to illustrate device highlights:


The Fe55 xray plot shows serial CTE. Note the break in the curve at about the center of the array. The effect is also seen if the charge is transferred in the other direction, to the other amplifier. We have not investigated whether or not this problem improves with elevated temperature. We were running rather cold for this test.

Graph of Fe55 showing charge trap


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