Characterization of MITLL CCID20 w85c2 thin 2k x 4k pixel size 15um x 15um new AR coating new laser annealing Reported by M.Wei Nov.10,1998 Both "R"(A) and "L"(B) amps imaging when cold "R" half side has poor serial CTE "L" half side CTE very good vertical CTE good small QE variation (brick wall) TEST CONDITIONS temperature: -130c Voltages: Vdd = +17.5v (18v for "L") Vr = +12.5v Vopg = 0v Vsub = 0v Vp1,2,3 = +2, -6v Vs1,2,3 = +6, -3v Vsw = +5, -5v RG = 10, 0v SCP = 10v changed gain of preamp. from 21 to 4.83 TEST RESULTS e-/DN: R: 0.46(vdd=17.5v) Determined by Fe55 x-ray test L: 0.56(vdd=18v) Determined by Fe55 x-ray test CTE: (@-130c) Serial R(1/2): R direction:0.9999042 Determined by Fe55 x-ray test L direction:0.9999752 Determined by Fe55 x-ray test L(1/2): very good Determined by Fe55 x-ray test Vertical: very good Determined by Fe55 x-ray test Read noise: R: 1.8e- DSC timing: 16us on data and 16us on baseline 2.1e- DSC timing: 4us on data and 4us on baseline L: 2.2e- DSC timing: 16us on data and 16us on baseline 2.7e- DSC timing: 4us on data and 4us on baseline Full well(nonmpp) 123 ke- Vertical traps: 4 in 4096x2048 area Dark current(@-130c) N/A QE(%) -125c 3200A 7.9 3500A 11.2 4000A 38.6 4500A 48.2 5000A 59.3 6000A 71.1 6500A 73.3 7000A 75.7 8000A 62.1 9000A 34.7 10000A 6.1 Fringing 8000A 6.1% 9000A 9.8% 10000A 19.5% --------------------------------------------- QE variation pattern at -124c 3200 49.4% 3500 46.4% 4000 5.4% 4500 0.2% 5000 1.7% Gain and Noise of CCID20 w85c2 --Vdd(vr=12.5v) "R" amp. Vdd e-/DN noise(e-) 17.5v 0.46 1.8 18v 0.45 1.6 18.5v 0.43 2.0 "L" amp. Vdd e-/DN noise(e-) 17.5v 1.08 5.0 (low gain) 18v 0.56 2.2 18.5v 0.49 1.9