MIT/Lincoln Labs CCID20 W17C2 CCD Test Results

This phase 2 MIT/Lincoln Labs 2Kx4K CCD has the improved backside treatment, giving it a low amplitude brickwall at most wavelengths. A summary report is available. Noteworthy points about this CCD include:

• Low"brickwall" pattern.
• Good serial CTE.
• Some blocked columns.

Original postscript files are available from our anonymous ftp server and these provide better resolution and clarity than is usually possible on a web page. Here are a few figures to illustrate device highlights:

Small "Brick wall" resulting in uniform QE
The brick wall pattern on this device is very small at most wavelengths, giving the device a spacially uniform QE.
Serial CTE
CTE measurements show lower than normal serial CTE.
Blocked Columns
Several columns are blocked near the shift register.

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This graph shows the QE variations caused by the brick wall pattern. QE was measured at the peak and in the valley of the brick wall as well as over a large area to obtain an average QE. Over most wavelengths the variations are very small.

Serial CTE as measured with Fe⁵⁵ is show here. Readout was through the left or B amplifier. CTE was about 0.999990 per pixel. Parallel CTE was even better, at about 0.999965 per pixel.

A defect near the serial register (at the top of this image) results in several blocked columns.

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