Characterization of MITLL
	CCID20 w17c2
	thin 2k x 4k
	pixel size 15um x 15um
	new AR coating
	new laser annealing
	Reported by M.Wei 	Nov.12,1998

Both "R"(A) and "L"(B) amps imaging when cold
Serial CTE good (R and L)
vertical CTE good
small QE variation (brick wall)
One dark column

TEST CONDITIONS

temperature:    -125c
Voltages:	Vdd 	= +17.5v 
		Vr  	= +12.5v
		Vopg 	= 0v
		Vsub	= 0v
		Vp1,2,3 = +2, -6v
		Vs1,2,3 = +6, -3v
          	Vsw	= +5, -5v
		RG	= 10, 0v
		SCP	= 10v

changed gain of preamp. from 21 to 4.83

TEST RESULTS

e-/DN:	        R:	0.46		Determined by Fe55 x-ray test
	        L:	0.50		Determined by Fe55 x-ray test
CTE: 
Serial		R:	0.99999246	Determined by Fe55 x-ray test
		L:	0.99999060 	Determined by Fe55 x-ray test
Vertical:		0.99999655	Determined by Fe55 x-ray test

Read noise:             R: 2.3e-        DSC timing: 16us on data and 16us
                                        on baseline
                           3.1e-        DSC timing: 4us on data and 4us
                                        on baseline
                        L: 2.3e-        DSC timing: 16us on data and 16us
                                        on baseline
                           3.1e-        DSC timing: 4us on data and 4us
                                        on baseline

Full well(nonmpp)	103 ke- 

Vertical traps:		27		in 4096x2048 area

Dark current(@-125c)	1.48e-/pixel/hour	

QE(%)
		-114c
3200A		16.7 	
3500A		31.5
4000A		53.7
4500A		58.0
5000A		67.1
6000A		74.8
6500A		76.4
7000A		77.1
8000A		61.6
9000A		29.8
10000A		 5.5

Fringing
 8000A		 5.6%
 9000A		 8.8%
10000A		15.2%
 
---------------------------------------------
QE variation pattern at -114c 
3200    32.3%
3500    31.1%
4000    6.1%
4500    4.0%
5000	1.8%
6000	0.4%

Gain Noise --Vdd (Vr=12.5v)
"R" amp.:
Vdd	Gain(e-/DN)	Noise
17.5v	0.46		2.3e-
18v	0.41		2.2

"L" amp.:
Vdd	Gain(e-/DN)	Noise
17.5v	0.50		2.3e-
18v	0.44		2.2