Phase 2 MIT/Lincoln Labs CCID20 CCD Test Results Summary

UNDER CONSTRUCTION

This table attempts to summarize the tests carried out here at Lick. The notation ND means that No Data are available for that item. Data on the "brick wall" pattern is not included in the table. There is really very little to distinguish between the first grade devices - . Our fringing amplitude is crudely measured so put little weight on differences, except the fringing in the thick-epi, high resistivity CCDs is really a lower amplitude.

CCD
(owner)

RO Noise
A &B
Amps
4us DCS

Serial
CTE
A and B
(per pixel)

Parallel
CTE
(per pixel)

QE (%) at
4000
6500
9000

 Dark
e/px/hr		 Traps
 Flatness Fringes
% at
8000
9000
10000

Column
or Row
Defects  
W12C1
(no pick)		 ? good
good		 good 31
86
29		 ND 5 ND 12
7
17		 1HC
See note. 
W16C2
AAO		 3.5,3.9 0.999998
0.999989		 0.999999 43
70
19		 ND 8 9µm p-p 8
8
18		 4HC 
See note.
W18C2
Keck		 3.1,3.0 V. Good
V. Good		 V. Good 40
71
31		 ND 3 6µm p-p 13
5
4		 None
 

Defects Legend:
HC(n) = Hot column at column n.
PBC=Partially Blocked Column.
PBCC(n)=Partially Blocked Column Cluster of n columns where n is 3 or more.

Notes: