MIT/Lincoln Labs CCID20 W78C1 CCD Test Results

The third frontside MIT/LL CCD (CCID20 W78C1) was tested recently. A report on those tests is available. In many ways this is the best frontside CCD we've ever seen, and we've seen a lot!

Readout noise and gain: Readout noise versus drain voltage.
Readout noise: Readout noise versus CDS time.
Linearity: On-chip amplifier linearity versus drain voltage.
Surface plot: The shape of the CCD at room temperature.

Here is a plot of read noise and overall system gain versus drain voltage. This is the lowest read noise of any CCD made today.

Here is a plot of read noise versus integration time in our correlated double sampling amplifier. This curve shows the best read noise versus CDS time of any CCD ever made.

Here is a set of high-level linearity curves obtained for MIT/LL CCID20 W78C1. Each curve represents a different output drain voltage, Vod, at fixed reset drain voltage, Vrd, of 12.5V. The Y axis is the percent difference from the mean count RATE measured at the total exposure levels given on the X axis. We believe the important parameter is the difference between Vod and Vrd. For instance, if you raise both voltages by 0.5v the linearity characteristics remain unchanged. Note that no voltage produces a strictly linear response (a flat horizontal line).

Here is a surface plot for CCID20 W78C1 at room temperature. If our measurments on a previous device are a guide, the shape will not change much with temperature.

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