MIT/Lincoln Labs CCID20 CCD Test Results Summary

This table attempts to summarize all of the tests carried out here at Lick. The notation ND means that No Data are available for that item. Data on the "brick wall" pattern is not included in the table. There is really very little to distinguish between the first grade devices - W6C1, W6C2, W7C1, W7C2, and W19C1. Our fringing amplitude is crudely measured so put little weight on differences, except the fringing in the thick-epi, high resistivity CCDs is really a lower amplitude.

CCD
(owner)

RO Noise
A &B
Amps
4us DCS

Serial
CTE
A and B
(per pixel)

Parallel
CTE
(per pixel)

QE (%) at
4000
6500
9000

 Dark
e/px/hr		 Traps
 Flatness Fringes
% at
8000
9000
10000

Column
or Row
Defects  
W6C1
SUB		 2.4 2.2 0.999997
0.999999		 0.999997 28.3
84.5
30.7		 4 @ -130 4 14 µm 10
12
27		 None 
W6C2
KECK		 2.3, 2.7 0.999999
0.999998		 0.999998 27.5
81.3
30.8		 6 @ -110 3 in
2048
rows		 3 µm 10
21
38		 None 
W7C1
CFHT		 2.1 2.1 0.999999
0.999994		 0.999998 26.7
79.5
28.6		 10 @ -130 4 27 µm with small void 5
10
26		 None

W7C2
ESO

 2.4, 2.4

0.999997
0.999998

  0.999999

30.7
91.8
32.9

  2 @ -110

2

6 µm p-p

5
8
16

1HC (0)
2 PBC
See note.
W19C1
AAO		 2.8 3.7 0.999999
0.999990		 0.999996 29.8
89.1
36.8		 5 @ -130 12 1 µm but
with epoxy void		 5
14
36		 1 HC (1555)
W20C1
DEAD		 2.3 2.0 0.999996
0.999998		 0.999999 27.8
88.1
37.1		 2 @ -130 21 ND ND
14
39		 2 PBC
1 PBCC(3)
See note.
W60C2 This device images, but very bright columns make most measurements impossible.  
W66C2
ESO		 5.4 ND 0.999997
ND		 "very good" 30.6
87.7
56.8		 30 @ -130 "very good" 12 µm 7
11
22		  Many columns
See note.
W72C2 ND ND ND ND ND 30.3
87.1
61.1 		 ND  ND 7µm 9
10
19		 Many columns
See note. 
W53C2
CFHT		 3.4 3.5 0.999999
ND		 0.999998 29.2
90.2
60.2 		 ND  ND ND 6
11
27		 6 -8 HC 
See note. 
W64C1
CFHT		 3.6 2.9 ND
0.999999		 0.999999 29
91
62 		 ND  ND ND 8
9
29		 8 HC
See note.  
W67C2
AAO		 3.0 3.9 0.999991
ND		 0.999995 31
88
57		 ND  ND ND 5
11
29		 2 HC
See note.  

Defects Legend:
HC(n) = Hot column at column n.
PBC=Partially Blocked Column.
PBCC(n)=Partially Blocked Column Cluster of n columns where n is 3 or more.

Notes:

W7C2 - The first column of the imaging area, on the A amplifier side, is saturated in a 1000s dark. However it does not appear to spill over into adjacent columns.
W20C1 - The tops of the two partially blocked columns and the three columns of the partially blocked column cluster are all close together, near row 2990 and column 138.
W53C2 - Most hot columns are in the second half of the array as seen in this highly compressed image. The serial register is at the top of the image. Very hot columns occur near the right and left edges.
W64C1 - Several very hot columns near B amplifier side as shown here.
W66C2 - Many hot columns as illustrated in this plot across a 1000s dark.
W67C2 - Two hots columns, only one of which saturates in this row plot across a 1000s dark.
W72C2 - Many hot columns as illustrated in this plot across a 1000s dark. This is the good side of the device. The other side has a super hot column that made testing impossible on that side.