The UCO/Lick Detector Development Lab has tested a number of MIT/Lincoln Labs CCID20 2Kx4K CCDs as part of the detector development consortium established by Gerry Luppino at the University of Hawaii. The following table lists the devices tested so far with the order corresponding to the chronological order in which the devices were initially tested. Each entry in the table references a report on our findings. There is also a summary table of tested characteristics for the thinned CCDs. Here is a drawing of the packaged device.
W40C1
The first device tested from an experimental run.
W40C2 The second device tested also from
the same experimental run as W40C1.
W78C1 The first CCD tested with Lincoln's
standard processing and one of the best frontside
CCDs we've ever seen.
W66C2 The first thinned Lincoln CCD tested.
This is a 40-micron thick high resistivity CCD!
W19C1 The first thinned standard epi Lincoln
CCD tested (August 7, 1997).
W20C1 The second thinned standard epi Lincoln
CCD tested (August 7, 1997). We have returned this CCD to Lincoln for repairs
(Oct. 13, 1997)
W6C1 Another thinned standard epi Lincoln
CCD.
W7C1 Another thinned standard epi Lincoln
CCD.
W6C2 This thinned standard epi CCD is superb.
W7C2 In some ways one of the best
thinned standard epi Lincoln CCDs tested so far.
W72C2 A high resistivity CCD.
W60C2 A high resistivity CCD with lots of
bright columns.
W53C2 A high resistivity CCD.
W64C1 A high resistivity CCD.
W67C2 A high resistivity CCD.
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